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This collection presents the proceedings from the 21st IEEE VLSI Test Symposium, showcasing groundbreaking advancements in the testing of integrated circuits and systems. It features research papers and discussions that highlight innovative methodologies, techniques, and technologies aimed at improving the reliability and efficiency of VLSI testing. The contributions from leading experts in the field provide valuable insights into current challenges and future directions in integrated circuit testing.

The collection features sixteen papers from a November 2003 conference, showcasing advancements in various fields including databases, algorithms, and artificial intelligence, with a focus on contributions from South American researchers. Key topics include the evaluation of spatial access methods and the application of a transgenetic algorithm to the traveling salesman problem, highlighting innovative approaches and techniques in software engineering, networking, and image processing.

By the very nature, mixed and augmented reality are highly interdisciplinary fields involving signal processing, computer vision, computer graphics, user interfaces, human factors, mobile computing, wearable computing, computer networks, distributed computing, information access, information visualization, and hardware design for new displays and sensors. MR/AR concepts are applicable to a wide range of applications. ISMAR 2003 provides an opportunity for MR/AR researchers to tackle ideas, concepts, and recent research results

ICNP 2003 is a highly selective conference dealing with all aspects of communication protocols including design, specification, analysis, verification, implementation, and performance. The topical coverage of the sessions reflects the activities in networking research. Overlay networks, peer-to-peer services, and sensor networks, which are relatively new research topics in networking, are noticeably represented in the proceedings.

Focusing on advancements in integrated circuit and system testing, this collection features the proceedings from the 21st IEEE VLSI Test Symposium. It highlights innovative methodologies and technologies aimed at improving testing processes, reflecting current trends and challenges in the field. The contributions from leading researchers and practitioners provide valuable insights into the future of VLSI testing, making it a significant resource for professionals and academics alike.