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This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 14 case studies illustrate concepts and applications. Three appendices provide helpful references. 1993 edition.
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A User's Guide to Ellipsometry, Harland G. Tompkins
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- Released
- 2006
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- (Paperback)
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