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- 512 pages
- 18 hours of reading
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A classic series in the field of quantitative measurement, Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance. 1989 edition.
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Foundations of Measurement Volume II, Amos Tversky, David H. Krantz, R. Duncan Luce, Patrick Suppes
- Language
- Released
- 2006
- product-detail.submit-box.info.binding
- (Paperback)
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- Title
- Foundations of Measurement Volume II
- Subtitle
- Geometrical, Threshold, and Probabilistic Representations
- Language
- English
- Publisher
- Dover Publications
- Released
- 2006
- Format
- Paperback
- Pages
- 512
- ISBN10
- 0486453154
- ISBN13
- 9780486453156
- Tags
- Non-Fiction, Social Sciences, Technology & Engineering, Science & Math, Philosophy, Psychology, Science, Mathematics, Technology
- Rating
- 3.35 out of 5
- Description
- A classic series in the field of quantitative measurement, Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance. 1989 edition.