Václav Holý Book order

This book explores the growing interest in high-resolution x-ray diffractometry and reflectivity, driven by advancements in the semiconductor industry and material research. It focuses on the significance of thin layers in optoelectronics, their interface quality, and the unique properties of thin metallic layers, including colossal magnetoresistance.

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties.