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Design for Testability, Debug and Reliability
Next Generation Measures Using Formal Techniques
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Focusing on the advancement of integrated circuits, this book presents innovative strategies for enhancing design testability, debugging, and reliability, particularly in safety-critical environments. It explores formal techniques like the Satisfiability (SAT) problem and Bounded Model Checking (BMC) to tackle challenges related to increasing test data volume and application time. Detailed evaluations of these methods are provided, alongside industry-relevant benchmarks, all within a unified framework that supports standardized software and hardware interfaces.
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Design for Testability, Debug and Reliability, Rolf Drechsler, Sebastian Huhn
- Language
- Released
- 2021
- Binding
- (Hardcover)
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- Title
- Design for Testability, Debug and Reliability
- Subtitle
- Next Generation Measures Using Formal Techniques
- Language
- English
- Authors
- Rolf Drechsler, Sebastian Huhn
- Publisher
- Springer International Publishing
- Released
- 2021
- Format
- Hardcover
- Pages
- 188
- ISBN13
- 9783030692087
- Series
- Tags
- Description
- Focusing on the advancement of integrated circuits, this book presents innovative strategies for enhancing design testability, debugging, and reliability, particularly in safety-critical environments. It explores formal techniques like the Satisfiability (SAT) problem and Bounded Model Checking (BMC) to tackle challenges related to increasing test data volume and application time. Detailed evaluations of these methods are provided, alongside industry-relevant benchmarks, all within a unified framework that supports standardized software and hardware interfaces.