Verbesserung der Signalauswertung für die Ultraschallmikroskopie

This dissertation describes the improvement of signal analysis in ultrasonic microscopy for nondestructive testing. Specimens with many thin layers, like modern electronic components, pose a particular challenge for identifying and localizing defects. In this thesis, new evaluation algorithms have been developed which enable analysis of highly complex layer-stacks. This is achieved by a specifi c evaluation of multiple reflections, a newly developed iterative reconstruction and deconvolution algorithm, and the use of classification algorithms with a highly optimized simulation algorithm. Deep delaminations inside a 19-layer component can now not only be detected, but also localized. The new analysis methods also enable precise determination of elastic material parameters, sound velocities, thicknesses, and densities of multiple layers. The highly improved precision of determined refl ections parameters with deconvolution also provides better and more conclusive results with common analysis methods.