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Kostengünstige Testmethoden für Semi-Custom ASICs

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Thomas Buchner

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University and college textbooks

Series: Fortschrittberichte VDI : Reihe 9, Elektronik, Mikro- und Nanotechnik

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Kostengünstige Testmethoden für Semi-Custom ASICs, Thomas Buchner

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Released: 1996

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