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Characterisation of degradation and failure phenomena in MOS devices, Paul Pfäffli
- Language
- Released
- 1999
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- Title
- Characterisation of degradation and failure phenomena in MOS devices
- Language
- English
- Authors
- Paul Pfäffli
- Publisher
- Hartung-Gorre
- Released
- 1999
- ISBN10
- 3896494988
- ISBN13
- 9783896494986
- Category
- University and college textbooks