The book is currently out of stock
Parameters
Categories
Book purchase
Thermoelastic analysis of devices by scanning near field thermal microscopy techniques, Anne Katrin Geinzer
- Language
- Released
- 2010
We’ll notify you via email once we track it down.
Payment methods
- Title
- Thermoelastic analysis of devices by scanning near field thermal microscopy techniques
- Language
- English
- Authors
- Anne Katrin Geinzer
- Publisher
- Der Andere Verl.
- Publisher
- 2010
- ISBN10
- 3862470970
- ISBN13
- 9783862470976
- Category
- University and college textbooks