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Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
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Using fine grain approaches for highly reliable design of FPGA-based systems in space, Mahtab Niknahad
- Language
- Released
- 2013
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- Title
- Using fine grain approaches for highly reliable design of FPGA-based systems in space
- Language
- English
- Authors
- Mahtab Niknahad
- Publisher
- KIT Scientific Publ.
- Publisher
- 2013
- ISBN10
- 3731500388
- ISBN13
- 9783731500384
- Category
- University and college textbooks
- Description
- Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.