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InduLIT: induktiv angeregte Lock-in-Thermografie zur zerstörungsfreien Funktionsprüfung in der Elektronik

Authors

Johannes Böhm

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University and college textbooks

Series: System integration in electronic packaging

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InduLIT: induktiv angeregte Lock-in-Thermografie zur zerstörungsfreien Funktionsprüfung in der Elektronik, Johannes Böhm

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Released: 2015

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