The book is currently out of stock
Parameters
- 148 pages
- 6 hours of reading
More about the book
The book focuses on advanced techniques for both production and periodic maintenance testing of semiconductor memory, particularly addressing multi-cell faults. It explores background selection and address reordering algorithms within multi-run transparent march testing processes. The author presents formal methods for generating multi-run tests, emphasizing solutions to enhance efficiency. Each method is thoroughly validated through analytical investigations and numerical simulations, ensuring a comprehensive understanding of the testing processes in modern semiconductor technology.
Book purchase
Multi-run Memory Tests for Pattern Sensitive Faults, Ireneusz Mrozek
- Language
- Released
- 2019
- product-detail.submit-box.info.binding
- (Paperback)
We’ll email you as soon as we track it down.
Payment methods
No one has rated yet.