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This book explores the growing interest in high-resolution x-ray diffractometry and reflectivity, driven by advancements in the semiconductor industry and material research. It focuses on the significance of thin layers in optoelectronics, their interface quality, and the unique properties of thin metallic layers, including colossal magnetoresistance.
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High-Resolution X-Ray Scattering, Tilo Baumbach, Ullrich Pietsch, Václav Holý
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- Released
- 2011
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- (Paperback)
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