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"Novel Algorithms for Fast Statistical Analysis of Scaled Circuits" addresses the challenges posed by manufacturing imperfections in nanometer-scale VLSI technology. It combines methods from computational finance, machine learning, and actuarial risk to develop innovative solutions for efficient statistical analysis of integrated circuits in this advanced domain.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Amith Singhee, Rob A. Rutenbar
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- Released
- 2012
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- (Paperback)
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