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RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
Dissertationsschrift
Authors
More about the book
The book delves into the challenges of measuring at millimeter-wave frequencies, particularly focusing on the parasitic effects caused by RF probes that can skew results despite calibration. Through electromagnetic field simulations of integrated circuits combined with RF probe models, the research aims to identify and understand these distortions, ultimately providing solutions to mitigate their impact on measurement accuracy.
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RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range, Daniel Müller
- Language
- Released
- 2018
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- (Paperback)
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- Title
- RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
- Subtitle
- Dissertationsschrift
- Language
- English
- Authors
- Daniel Müller
- Publisher
- Karlsruher Institut für Technologie
- Released
- 2018
- Format
- Paperback
- Pages
- 214
- ISBN13
- 9783731508229
- Category
- Electrical engineering
- Description
- The book delves into the challenges of measuring at millimeter-wave frequencies, particularly focusing on the parasitic effects caused by RF probes that can skew results despite calibration. Through electromagnetic field simulations of integrated circuits combined with RF probe models, the research aims to identify and understand these distortions, ultimately providing solutions to mitigate their impact on measurement accuracy.