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The Field-Ion Microscope (FIM) remains unparalleled in its ability to resolve single atoms on metal surfaces, despite advancements in microanalytical tools. Initially developed by Milller, the FIM was later combined with a time-of-flight (ToF) mass spectrometer, creating the Atom-Probe FIM, aimed at enhancing the understanding of field ionization and evaporation. Although initially limited to refractory metals, the introduction of micro-channel electron multipliers expanded its application to more common metals like iron, copper, nickel, and aluminum, significantly impacting metallurgical studies.
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Field-Ion Microscopy, R. Wagner
- Language
- Released
- 2011
- product-detail.submit-box.info.binding
- (Paperback)
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- Title
- Field-Ion Microscopy
- Language
- English
- Authors
- R. Wagner
- Publisher
- Springer Berlin Heidelberg
- Released
- 2011
- Format
- Paperback
- Pages
- 132
- ISBN13
- 9783642686894
- Category
- Chemistry, Nature in general
- Description
- The Field-Ion Microscope (FIM) remains unparalleled in its ability to resolve single atoms on metal surfaces, despite advancements in microanalytical tools. Initially developed by Milller, the FIM was later combined with a time-of-flight (ToF) mass spectrometer, creating the Atom-Probe FIM, aimed at enhancing the understanding of field ionization and evaporation. Although initially limited to refractory metals, the introduction of micro-channel electron multipliers expanded its application to more common metals like iron, copper, nickel, and aluminum, significantly impacting metallurgical studies.