Mismatch and Noise in Modern IC Processes

Focusing on the critical issues of mismatch and noise, this book delves into their impact on modern integrated circuit design. Mismatch, a local variability affecting adjacent transistors, poses challenges in analog and memory systems, as well as in digital logic, where it can introduce uncertainties in delay times. Noise, a dynamic effect that alters circuit behavior during operation, is also explored in detail, addressing its origins and implications for both analog and digital circuits. The comprehensive analysis includes practical solutions for minimizing these effects.