Wei Gao Book order

Recent advancements in discrete mathematics are explored, focusing on binding number conditions for fractional (g,f,n',m)-critical covered and uniform graphs. The book presents a detailed analysis of dendrimers through topological index computations. Additionally, it determines distance-based indices and polynomials for armchair polyhex nanotubes and nanotori. The study also includes an examination of the reverse eccentric connectivity index of haphthylenic lattices, offering insights into these complex mathematical structures.

The book explores the application of graph theory in theoretical chemistry, where atoms are modeled as vertices and chemical bonds as edges, creating a graphical representation of molecular structures. It highlights how graph theory can be used to derive fundamental properties of compounds. Additionally, the text presents recent research findings at the intersection of graph theory and computer science, showcasing advancements and innovative approaches in these fields.

Recent advancements in graph theory and machine learning are explored through ten distinct sections, each representing an unpublished manuscript. The book highlights significant contributions in chemical graph theory, coloring theory, and their applications in engineering. These findings not only enrich the discipline but also provide valuable insights for practical applications.

The book delves into the challenges faced by low-income countries in testing the properties of newly developed nanomaterials due to a lack of resources. It highlights the relationship between the chemical characteristics and molecular structures of these materials. By focusing on topological indices, the author explores how understanding these indicators can compensate for experimental limitations, ultimately aiding in the analysis of various common nanostructures. This approach offers a potential solution to the resource constraints in nanoscience research.

Focusing on the emerging field of precision nanometrology, this book explores its critical role in nanoscale manufacturing, particularly in semiconductors and optical components. It details optical sensors essential for measuring angles and displacements, followed by an examination of various scanning-type measurement systems for assessing surface forms and stage motions. Key topics include error separation algorithms, micro-aspheric measurement, and scanning probe microscopy. The text serves as a valuable resource for researchers and engineers in precision engineering and nanotechnology.