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Strukturuntersuchungen an epitaktisch abgeschiedenen SiC-Schichten, Hans-Peter Lang
- Language
- Released
- 1998
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- Title
- Strukturuntersuchungen an epitaktisch abgeschiedenen SiC-Schichten
- Language
- German
- Authors
- Hans-Peter Lang
- Publisher
- Utz, Wiss.
- Released
- 1998
- ISBN10
- 3896753681
- ISBN13
- 9783896753687
- Series
- Werkstoffwissenschaften
- Category
- University and college textbooks