The book is currently out of stock
Design for Testability, Debug and Reliability
Next Generation Measures Using Formal Techniques
Authors
More about the book
Focusing on advancements in integrated circuits, the book presents innovative strategies for enhancing design reliability and testability, particularly in safety-critical applications. It explores formal techniques like the Satisfiability (SAT) problem and Bounded Model Checking (BMC) to tackle challenges related to test data volume and application time. Detailed discussions and extensive evaluations of these methods are provided, alongside industry-relevant benchmarks. The authors integrate these approaches into a unified framework with standardized software and hardware interfaces.
Book purchase
Design for Testability, Debug and Reliability, Sebastian Huhn, Rolf Drechsler
- Language
- Released
- 2022
- product-detail.submit-box.info.binding
- (Paperback)
We’ll notify you via email once we track it down.
Payment methods
- Title
- Design for Testability, Debug and Reliability
- Subtitle
- Next Generation Measures Using Formal Techniques
- Language
- English
- Authors
- Sebastian Huhn, Rolf Drechsler
- Publisher
- Springer International Publishing
- Released
- 2022
- Format
- Paperback
- Pages
- 188
- ISBN13
- 9783030692117
- Category
- Computers, IT, Programming
- Description
- Focusing on advancements in integrated circuits, the book presents innovative strategies for enhancing design reliability and testability, particularly in safety-critical applications. It explores formal techniques like the Satisfiability (SAT) problem and Bounded Model Checking (BMC) to tackle challenges related to test data volume and application time. Detailed discussions and extensive evaluations of these methods are provided, alongside industry-relevant benchmarks. The authors integrate these approaches into a unified framework with standardized software and hardware interfaces.