Springer Series in Surface Sciences - 65: Kelvin Probe Force MicroscopySascha SadewasserSold outTrack
Routledge Specialist Dictionaries Series - 1: German Technical Dictionary / Universal-Wörterbuch der Technik EnglischVarious authorsSold outTrack
Computational Microelectronics: Strain-Induced Effects in Advanced MOSFETsViktor SverdlovSold outTrack
