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Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In this book, the authors look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company.
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From scientific instrument to industrial machine, Richard Doornbos
- Language
- Released
- 2012
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- (Paperback)
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