Parameters
- 689 pages
- 25 hours of reading
More about the book
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Book purchase
Scanning Electron Microscopy and X-Ray Microanalysis, Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Language
- Released
- 2003
- product-detail.submit-box.info.binding
- (Hardcover),
- Book condition
- Good
- Price
- €16.49
Payment methods
No one has rated yet.
- Subtitle
- Third Edition
- Language
- English
- Authors
- Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Publisher
- Springer
- Released
- 2003
- Format
- Hardcover
- Pages
- 689
- ISBN10
- 0306472929
- ISBN13
- 9780306472923
- Series
- Tags
- Non-Fiction, Textbooks, Technology & Engineering, Health & Medicine, Science & Math, Other Textbooks, References & Manuals, Medical Studies
- Description
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.